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Mots clés
18O
Ferromagnetic resonance
Hysteresis
Aluminium
Magnetic semiconductors
15N
Topological defects
7550Pp
Topological insulators
Low energy electron diffraction LEED
Kossel diffraction
AFM
Defects
Nuclear resonance profiling NRP
Epitaxy
Diffusion
Thin films
Pb centers
Ion implantation
Charge exchange
Zinc oxide
Isotopic Tracing
Silica
Silicon
EPR
Metal-insulator transition
Atomic Layer Deposition ALD
Aluminum
SiC
Stable isotopic tracing
ADSORPTION DESORPTION HYSTERESIS
Indium oxide
Nanoparticles
Measurement
HfO2
Interface defects
Oxygen deficiency
XRD
XPS
Alloy
Acoustic
Acoustic propreties of solid
Alloys
Annealing
Periodic multilayer
8140Ef
17Op
27Aldp
ALD
Thin film
Adsorption Isotherms
Ageing
7550Ee
27Alda
Adsorbed layers
17Opp
27Ald p&α
Al2O3
Magnetic anisotropy
Nanostructures
Nitridation
Raman spectroscopy
Epitaxial growth
Capillary condensation
Energy loss
Multilayer
Pulsed laser deposition
17O
NRP
Channeling
Passivation
Photoluminescence
X-ray diffraction
RBS
Density functional theory
6855Jk
Rutherford backscattering spectrometry RBS
Silicon carbide
Nuclear reaction analysis
PIXE
Sputtering
13C
18O resonance
Auger electron spectroscopy AES
Gallium oxide
Adsorption
Transparent conductive oxide TCO
Oxidation
Growth
Evaluation
GaMnAs
2H
Nickel
Silicon Carbide
3C-SiC
AC susceptibility
Ion beam analysis
Gold
7630Lh
Magnetization curves